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Technical Paper

Alpha Particle Emissions: An Overlooked Risk for Soft Errors in Advanced Packaging

As advanced packaging density increases, alpha particle emissions present a growing reliability risk. This article examines soft error mechanisms and solutions to mitigate failures in AI, HPC, and high-density packages.
MacDermid Alpha Electronics Solutions

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■	A New Optical Ball Grid Array Package Development for Automotive Optical Sensor
■	Automated X-Ray Metrology: Enhancing Quality and Efficiency in Wafer and Panel-Level Applications
■	Alpha Particle Emissions: An Overlooked Risk for Soft Errors in Advanced Packaging
■	Revolutionizing IC Packaging with High-Density RDL Technology
■	EOTPR Fine pitch probing for die-to-die interconnect failure analysis in chiplet devices
■	Die-on-Tab for Compound Semiconductors: Enabling Advanced RF Power Systems
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Full Technical Paper List

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