| Sponsor |
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A Universal AI-Powered Segmentation Model
A new universal deep learning model enhances automated optical inspection by accurately segmenting images for both PCBAs and semiconductors. It boosts defect detection efficiency, simplifies model management & supports auto-programming.
Nordson Test and Inspection
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| Press Release |
March 4, 2026 - Click the title to read the full press release.
Aehr Test Systems announced it has received a follow-on purchase order from its lead silicon photonics customer for production wafer-level test and burn-in of silicon ...
Aehr Test Systems
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