| Sponsor |
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A Universal AI-Powered Segmentation Model
A new universal deep learning model enhances automated optical inspection by accurately segmenting images for both PCBAs and semiconductors. It boosts defect detection efficiency, simplifies model management & supports auto-programming.
Nordson Test and Inspection
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| Press Release |
February 25, 2026 - Click the title to read the full press release.
Smoltek announces that an independent, third-party reliability test of the Company’s CNF-MIM capacitor technology has confirmed the previously reported internal life test ...
Smoltek
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