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A Universal AI-Powered Segmentation Model
A new universal deep learning model enhances automated optical inspection by accurately segmenting images for both PCBAs and semiconductors. It boosts defect detection efficiency, simplifies model management & supports auto-programming.
Nordson Test and Inspection
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| Press Release |
February 24, 2026 - Click the title to read the full press release.
Teledyne HiRel Semiconductors​ announced the TDLNA0840EP, an ultra-low-power, wideband, low-noise amplifier (LNA) that delivers guaranteed operation to 4.0 GHz, while ...
Teledyne HiRel Semiconductors
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