| Sponsor |
|
A Universal AI-Powered Segmentation Model
A new universal deep learning model enhances automated optical inspection by accurately segmenting images for both PCBAs and semiconductors. It boosts defect detection efficiency, simplifies model management & supports auto-programming.
Nordson Test and Inspection
|
|
| Press Release |
January 29, 2026 - Click the title to read the full press release.
Aehr Test Systems announced it will participate in the Oppenheimer 11th Annual Emerging Growth Conference being held virtually February 3-4, 2026. Aehr Test CEO Gayn ...
Aehr Test Systems
|
Free Newsletter Subscription
Semiconductor Packaging News is built for professionals who bear the responsibility of looking ahead, imagining the future, and preparing for it.
Insert Your Email Address
|
|
