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packaging news
Sponsor
ZEISS

See WLCSP Defects with Advanced 3D X-ray Microscopy
Two case studies show the effectiveness of high-res 3D XRM for detecting various defects in WLCSP containing RDL & Cu-pillar microbumps. Read more.
ZEISS Microscopy
Pac-Tech
Press Release
November 3, 2025  -  Click the title to read the full press release.

Cactus Materials Inc. Expands Silicon Carbide Portfolio



Cactus Materials Inc. announced the expansion of its SiC product portfolio with the launch of new 3.3 kV high-power, high-temperature MOSFETs and power components ...

Cactus Materials Inc.
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Sponsor
Tresky

Flip Chip Bonding / C4 technology
High pression process of assembly and connection technology (AVT) for contacting unhoused semiconductor chips by means of balls - so-called "bumps".
Tresky Automation
SEIKA-America