semiconductor
packaging news
Sponsor
ZEISS

See WLCSP Defects with Advanced 3D X-ray Microscopy
Two case studies show the effectiveness of high-res 3D XRM for detecting various defects in WLCSP containing RDL & Cu-pillar microbumps. Read more.
ZEISS Microscopy
Pac-Tech
Press Release
October 31, 2025  -  Click the title to read the full press release.

Test sockets and change kits for automated test equipment



At this year's productronica, Quasys GmbH will be presenting its extensive range of test sockets and change kits for automated testing (ATE – Automated Test Equipment), ...

Quasys GmbH
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Sponsor
Tresky

Flip Chip Bonding / C4 technology
High pression process of assembly and connection technology (AVT) for contacting unhoused semiconductor chips by means of balls - so-called "bumps".
Tresky Automation
SEIKA-America