A study about 3D stacking of passive SMD elements
This study demonstrates laser assisted bonding (LAB) of SMD Tantal Elko and MLCC capacitors and presents a comparison to conventional bonding using solder paste and reflow oven. PacTech
Technical Paper
Detecting Wafer Level Cu Pillar Defects Using 3D X-ray Microscopy (XRM) with Submicron Resolution
Two case studies show how advanced high-resolution 3D XRM can detect and visualize defects in Wafer Level Chip Scale Packages (WLCSP) containing RDL and Cu pillar microbumps.
ZEISS
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