Technical Papers Index
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430 technical papers.

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Oct 3, 2022
Atmospheric Oxygen-only Plasma for Decapsulation of Advanced Packages
Work presented in this paper demonstrates how artifact-free Microwave Induced Plasma (MIP) decapsulation enables true root cause failure analysis of ...
JIACO Instruments

Aug 23, 2022
Effects of Long-Term Storage on Mechanical and Electrical Integrity
This white paper examines the effects on mechanical integrity and electrical performance of semiconductor components stored for up to 17 ...
Rochester Electronics, LLC

Jul 29, 2022
The Great Debate: Ball Bonding vs Wedge Bonding
Over the years, microelectronic wire bond process and packaging engineers have debated whether to use ball or wedge bond technologies. ...
Palomar Technologies, Inc.

Jul 20, 2022
Chip-Last HDFO Interposer-PoP
This paper will discuss package-level characterizations on the interposer-PoP with HDFO RDL routing layer, package z-height evaluation, temperature-dependent package ... ...
Amkor Technology, Inc.

Jun 30, 2022
Air Gap, Buried Layer and Micro-Channel Measurement
Air Gap thickness, the vertical distance of two planes or the depth of a capped microfluidic channel are important parameters ...

Jun 24, 2022
Essential Practices for Gold Mitigation of Electronic Components
The ideal method to facilitate the repeatable and reliable removal of gold plating from electronic components is to use a ...
Circuit Technology Center

Jun 2, 2022
The Journey to Full-Scale Semiconductor Packaging Manufacturing
The challenges faced from package design and prototyping, through process development and process optimization are presented to ensure the device ...
Palomar Technologies

May 24, 2022
Dispositioning Hermetic Microelectronic Components With High Internal Moisture
This white paper presents four options for dispositioning hermetic electronic components non-compliant on internal water vapor content. ...
Robert K. Lowry, Electronic Materials Consultant

May 10, 2022
Automated Wafer TTV & Shape Metrology
Wafer thickness, TTV, flatness and warpage are important parameters to be monitored for wafer production as well as device processing. ...

May 2, 2022
Empowering RF Front End Cellular Innovations with DSMBGA
With the introduction of 5G, cellular frequency bands have increased considerably, requiring innovative solutions for the packaging of RF front-end ...
Amkor Technology, Inc.

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