Introducing Viscom’s Revolutionary iX7059 One

Dear Sir or Madam,

The SEMICON WEST 2024 is just around the corner, and we are thrilled to unveil our latest breakthrough in the semiconductor universe – our iX7059 One. This is the ONE perfect solution for your high-resolution requirements for semiconductors, advanced packaging, and a variety of other applications. It is the ONE and ONLY system you need for comprehensive X-ray inspection with the best image quality and defect recognition!

With our iX7059 One, precision is not just a goal – it is a guarantee! Equipped with state-of-the-art imaging capabilities, this system delivers exceptional image quality down to an incredible 1 μm resolution! This new AXI captures every detail with stunning clarity.

Enhance your production quality and embrace the future of X-ray inspection with our iX7059 One. We are confident that this system will improve your process and product quality, ensuring your products will fulfill the highest standards.

What truly distinguishes our innovative system is its versatility: Our Business Development Director Dr. Nicolas Thiemeyer explains:

Nicolas.Thiemeyer@viscom.de

“The new iX7059 One is the perfect extension of our portfolio and provides new solutions for many inspection challenges and applications. With the improved resolution of down to 1 micron and a new level of image quality in 2D and 3D, this AXI is a perfect system for the detection of very small defects. The “One” is mostly used for semiconductor applications and is enabling new inspection strategies for many different types of semiconductor devices.”