Press Release - Multitest Elektronische Systeme GmbH
September 25, 2017  -  Click the title to read the full press release.

Multitest Successfully Introduced New Super-Sharp Gemini Kelvin Probes



Multitest recently passed an evaluation of new super-sharp Gemini Kelvin (GMK) probes. The evaluation took place at an OSAT testing devices for a major customer. Although ...

Multitest Elektronische Systeme GmbH
May 30, 2018
Xcerra combines innovative contacting technology with reliable test handling solution
Multitest recently delivered a production interface solution to a customer for OTA testing of a 60 GHz UltraGig single-chip integrated Antenna in Package (AiP). ...
May 15, 2018
Multitest MT2168 Pick-and-Place Handler option for avoiding ESD pre-damages
The Multitest MT2168 pick-and-place handler now offers a ground fault monitoring option. The ground fault monitoring option is part of a feature set that will enhance ...
May 8, 2018
Smart Maintenance Mechanics Ensure Significantly Higher Uptime: Multitest Quick Lock for Test Sockets
Multitest's Quick Lock Contact Unit Holder (CUH) for ecoAMP and DuraKelvin Plunge-to-Board set-ups on the MT9928 gravity feed handler has been adopted ...
April 19, 2018
Multitest High Voltage Contactors: Proven Solutions for Automotive Test Applications
Multitest's customized high voltage contacting solutions have been well accepted for volume production. Multitest received a significantly increased order volume ...
March 16, 2018
Multitest Sensor Test Modules Ready for Increased Productions Needs
Multitest has now launched the next generation of its 6DOF gyro test module for singulated packages, which provides significant production benefits resulting in even ...
January 18, 2018
Multitest adds 'Super-Sharp' option to Quad Tech probes
Multitest's Super-Sharp Option for Quad Tech probes provides an increase in test cell throughput and maintains the fidelity of the test signal over longer uninterrupted ...
November 27, 2017
Multitest InWaferX for final test of singulated WLCSPs
Multitest's new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements ...
November 6, 2017
Multitest's Unique Interface Solution Delivers Unprecedented Life-Time in Volume Production
Multitest's mmWave contactor is a proven broadband production solution for RF applications up to 100GHz. In a presentation by Jeffrey Finder, Senior Product ...
September 25, 2017
Multitest Successfully Introduced New Super-Sharp Gemini Kelvin Probes
Multitest recently passed an evaluation of new super-sharp Gemini Kelvin (GMK) probes. The evaluation took place at an OSAT testing devices for a major customer. Although ...
August 4, 2017
Multitest MiCon® Contactor: Advantages of Cantilever Design for MCU and ASIC Testing
Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPs ...
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