May 3, 2017 - Click the title to read the full press release.
ZEISS Files Patent Infringement Lawsuits Against Nikon
ZEISS announced that it is filing initial legal claims against Nikon for infringement of more than ten patents, related to a broad range of products in the fields ...
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July 13, 2017 ZEISS Enters the Semiconductor Process Control Market ZEISS is fueling its growth strategy by expanding into a new market in the semiconductor industry. Through its new Process Control Solutions (PCS) business unit ...
May 3, 2017 ZEISS Files Patent Infringement Lawsuits Against Nikon ZEISS announced that it is filing initial legal claims against Nikon for infringement of more than ten patents, related to a broad range of products in the fields ...
September 22, 2014 ZEISS Offers New Autoloader for 3D X-ray Imaging ZEISS announces automated sample handling for ZEISS Xradia Versa 3D X-ray microscopes (XRM) for submicron imaging. XRM Autoloader helps gain critical ...
September 10, 2014 Automated Correlative Microscopy from ZEISS This means the productivity of your existing or new ZEISS FIB-SEM can increase by multiples. Locate sub-surface, buried regions-of-interest ...