We search for industry news, so you don't need to.
Press Releases

June 18, 2014

Xcerra(TM) President & CEO, Dave Tacelli to Join Panel Discussion at Semicon West

Panel "Testing the Future" hosted by CAST

Norwood: Xcerra(TM) Corporation today announced that Dave Tacelli will join the panel discussion "Testing into the Future" at the upcoming Semicon West Show, scheduled to take place July 8 to 10 in San Francisco. The panel discussion will be part of the TechXpot North session "Seeking Growth" on Tuesday, July 8, 2014 from 10:30 am - 12:30 pm hosted by Collaborative Alliance for Semiconductor Test (CAST).

This session will start with updates on the ITRS and CAST activities. The historical barriers between Fab, Assembly and Test are breaking down as new technologies are adopted. The ITRS Test Roadmap identifies these technologies and CAST activities are directed towards pre-competitive solutions to enable them. 

The presentations will lead into the panel session that will discuss the business implications and opportunities.

David G. Tacelli was appointed president and chief executive officer of LTX Corporation in November 2005 and continued in that capacity following the formation of LTX-Credence(TM) in August 2008. In December 2013 the Company closed on the acquisition on Multitest and Everett Charles Technologies more than doubling the Company size and its addressable market. In May 2014 Xcerra Corporation, the umbrella company of LTX-Credence, Multitest, Everett Charles Technologies and atg Luther & Maelzer was established. Continuing the role of president and CEO, Tacelli is responsible for shaping the company's vision and strategy for developing innovative semiconductor test solutions including tester, handling equipment and interface products, as well as, the Company's printed circuit board (PCB) testers and printed circuit board assembly (PCBA) fixture design and fabrication services.

More information can be found on www.Xcerra.com/SemiconWest



Xcerra

For more information visit:
http://www.Xcerra.com

October 1, 2018
Xcerra's Diamondx test platform brings flexibility and scalability to display driver test
Xcerra's highly flexible Diamondx test platform can scale up to over 5000 display driver digitizers, supporting aggressive multi-site production strategies. With ...
September 7, 2018
Xcerra's MT2168 XT Semiconductor Test Handler now available with advanced Double Device Detection and Automatic Temperature Calibration
Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both options target optimization of test floor processes, allowing the customer ...
August 16, 2018
Testing of LED Devices with Superior Temperature Performance in High Volumes
The Xcerra MT9510 XP pick-and-place handler successfully passed the onsite buy-off for an automotive LED test application at a leading lighting manufacturer. ...
August 13, 2018
Xcerra introduces HSI1x 12.8 Gbps SerDes test instrument
The new Xcerra HSI1x instrument for the well-established Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8 Gbps data rate. The instrument...
July 27, 2018
Xcerra's MT2168 XT Semiconductor Test Handler installed
The Xcerra MT2168 XT pick-and-place handler was installed for a tri-temp module test application at a major player in global semiconductor manufacturing. With its ...
July 20, 2018
Xcerra Announces Microchip Technology as the Recipient of the 500th Diamondx Test System
Xcerra announced that it has shipped the 500th Diamondx test system reaching a critical milestone for Xcerra's flagship system-on-a-chip (SOC) test system. The 500th ...
March 28, 2018
Xcerra Announces Preferred Supplier Agreement with Elmos
Xcerra announced that it has entered into a preferred supplier agreement with Elmos, a supplier of semiconductor and sensor devices to the automotive industry. Under ...
February 15, 2018
Xcerra Test Cell Solutions Expand to the Japan Market
Xcerra, with its recognized industry-leading suite of flexible and cost-effective MEMS test cell offerings, announced that a leading global manufacturer of high-quality ...
January 5, 2018
MEMS/Sensor Test: Xcerra's Test Cell Qualified for Barometric Test
Xcerra continues to expand its TCI (Test Cell Innovation) customer base after completing a qualification at a major European IDM for a fully integrated and prevalidated ...
September 12, 2017
Xcerra MEMS Test Cell at SITRI for Barometric Pressure Sensors
Xcerra announced that SITRI, the Shanghai Industrial uTechnology Research Institute, has added barometric pressure sensor test and calibration to its test services offering. ...