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Thursday, Sept 11, Baltimore, MD Asymtek presents free
coating and jet dispensing technology workshop including Cyber Technologies, Dow Corning, Dymax, Henkel, Lockheed Martin and HumiSeal discussing latest developments in conformal coating processes, assembly materials and jet dispensing. Reserve your seat now, breakfast & lunch included. Learn more
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February 1, 2008
Dr. Aleksej M. Rodin, Via Team Leader, XSiL Ltd.
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| Dr. Aleksej M. Rodin, Via Team Leader, XSiL Ltd.
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Through-Silicon Vias (TSVs) for 3D Interconnects are one of the hottest topics of 2008. Two technologies can be used today to produce these vias: DRIE and laser drilling. In the past, laser drilling processes suffered from throughput and size limitations. Laser technology was then directed towards applications with low density requirements such as flash memory. Advances in laser process development and throughput achieved at XSiL will enable the usage of laser-drilled TSVs for a wider range of applications.
Recent advances in the processing of blind vias drilled in silicon by UV DPSS lasers exhibit high throughput, clean top surface and excellent sidewall quality along with negligible heat-affected zone. The previously accepted via size limitation of ~30µm diameter is no longer valid.
With the X300V-Ultra via drilling tool launched by XSiL in 2008, drilling rates exceeding 2000-2500vias/s have been achieved, with no impact on quality. An efficient cleaning process is incorporated into production tools, eliminating residual silicon debris. Via depth uniformity of +/-4% or better is achievable over a 300mm wafer.
The taper angle of the scallop-free via sidewalls approaches the desirable 850 value for void free copper plating and can in turn eliminate the need for ion assistance during the PVD process. Being maskless, the laser-based processes eliminate the need for various expensive lithographic steps such as coating, exposure and photoresist stripping.
Laser-produced vias are safe for active devices and suitable even for structured wafers comprising Cu and Al pads and oxide layers. Via diameters of 10-80µm can be drilled. This range of sizes satisfies the majority of current requirements for industrial interconnect applications. Recently, XSiL obtained its first R&D results for via diameters of 4-6ěm, which addresses targeted roadmaps of DRAM manufacturers till 2012.
It already appears that future advances in NAND flash and DRAM memory applications are difficult to envisage without the advantages of laser technology, and the same could probably be said for CMOS sensors. Applications development in laser machining is ongoing with the majority of customers in the semiconductor market. Companies from Asia have been especially pro-active in these areas over the last few years.
Dr. Aleksej M. Rodin
, Via Team Leader
XSiL Ltd.
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March 25, 2008
Phil Vere, Managing Director – Bond Testing, Dage Precision Industries
Semiconductor packaging continues to gravitate toward 3D packaging such as package-in-package (PiP), package-on-package (PoP) and system-in-package (SiP) driven in large part by the growing functionality of handheld products. These 3D packages typically contain more bumped devices as semiconductor suppliers’ move away ...
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February 4, 2008
Peter Biocca, Senior Market Development Engineer, Kester
Year 2007 saw a global increase in lead-free solder use, mostly SAC. Interest in Kester’s K100LD tin/copper-based solder increased. Industries exempt from RoHS — medical, automotive, and telecom — began looking to lead-free. Kester, under ITW, realigned operations for an intimate approach to product ...
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February 1, 2008
Dr. Aleksej M. Rodin, Via Team Leader, XSiL Ltd.
Through-Silicon Vias (TSVs) for 3D Interconnects are one of the hottest topics of 2008. Two technologies can be used today to produce these vias: DRIE and laser drilling. In the past, laser drilling processes suffered from throughput and size limitations. Laser technology was then directed towards applications with low density ...
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January 31, 2008
Lyman Brown, Executive Vice President and Chief Operating Officer, BPM Microsystems
We see 2008 as an exciting year for BPM. Global demand for OEM automotive electronics is expected to continue to grow. Quality MCU programming will be the key for the strong demand for safety, entertainment and communication systems. BPM's broad complex MCU programming support can help out ...
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January 30, 2008
John Wood, Systems Engineer, Plasma Etch, Inc.
In our quest to provide the best value in plasma treatment equipment we have upgraded our PE-100 bench top system with an accurate mass flow meter & precision needle valve gas train. This newest PE-100 now comes standard with one mass flow meter & may be ordered with more as needed. This ...
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