WICHITA, KS - Integra Technologies, LLC., leading supplier of test services in the US, announced that it has added a Verigy 93K P1000 tester for package and probe test of high speed, high pin count, mixed signal devices and high speed multi-site memory test. The tester has 800 digital pins with 1000Mbits/sec data rates and greater than 600Mhz frequency capabilities. Digital pattern depths of 56Meg including memory test Algorithmic Pattern Generator capabilities. Analog resources include PMU per pin, 16 power supplies and 16/24bit Digitizers and 16/18bit Waveform Generators.

Integra has also added a TSK UF3000 12" Wafer Prober.The addition of this prober to Integra's existing equipment set, gives them capability to probe 3" to 12" wafers.