Verigy's Support Team Speeds Ramp-to-Volume for Leading Flash Memory Supplier in Taiwan

CUPERTINO, Calif. – Verigy (NASDAQ: VRGY), a premier semiconductor test company, today announced that Winbond Electronics Corp., a leading flash memory supplier, has purchased multiple Verigy V5400 flash memory testers for its Taichung, Taiwan facility. Winbond will use the systems for wafer sort testing of its SpiFlash® serial flash memories which feature the Serial Peripheral Interface (SPI), and are used in PCs, cell phones and other mobile devices. Winbond selected the V5400 over other flash memory testers on the market because it offers better cost-of-test, and because the large installed base of V5400 testers in Taiwan will allow them to more easily serve their customers. Winbond already uses the Verigy V5000e engineering workstation, also part of the V5000 Series, which allows them to transfer existing test programs to the V5400 systems for high volume production, generating further efficiencies.

For flash wafer sort, the V5400 offers up to 4608 I/O channels and the flexibility to be configured with up to 144 sites per system. This delivers a dramatic reduction in the cost-of-test over traditional flash testers. The flexible, fifth-generation Tester-Per-Site® architecture of the V5400 allows manufacturers to test a wide variety of memory devices.

“Our advanced 300 mm wafer fab manufacturing and competitive cost structure are very important to our success in the flash market,” said Wilson Wen, executive vice president, Winbond. “In addition to providing reliable, cost-effective wafer sort equipment , Verigy’s applications and uptime support team also helped us ramp very quickly to meet our time-to-market goals.”

“The V5000 memory test platform has been adopted worldwide by tier one suppliers. The installed base includes more than two hundred V5400s installed at OSAT customers in Taiwan," said Pascal Ronde, vice president of sales, service and support, Verigy. “Now Winbond is leading the way as the first Taiwan-based flash IDM* to use the V5400 to adopt their 300mm process.”

About the Verigy V5000

The V5000 Series of memory test systems offers a complete solution for all memory test needs, from engineering development to high-volume production. With a scalable platform architecture and optimized tester resources to efficiently test all memory types, the V5000 Series solves the widest variety of memory test issues. The Programmable Interface Matrix technology enables significantly lower cost of final test through extremely high pin count (24,576 pins), the highest available parallelism (x512 NAND, x512 NOR, x576 SPI and x384 MCPs) and greatest tester utilization. The V5000 fifth generation Tester-per-Site® architecture allows customers complete test transportability and stability, for new levels of efficiency in migrating tests from design to sort to final test.