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Viewpoint Index

February 2, 2017

VIEWPOINT 2017: Loofie Gutterman, President & Co-Founder, Marvin Test Solutions
VIEWPOINT 2017: Loofie Gutterman, President & Co-Founder, Marvin Test Solutions
Loofie Gutterman, President & Co-Founder, Marvin Test Solutions, Inc.
Marvin Test Solutions is looking forward to 2017 as a year of growth for our TS-900 semiconductor test solutions product line.

The TS-900 family of testers continues to evolve and provides a cost-effective, small-footprint, open architecture alternative to "big iron" ATE.

During the latter half of 2016, we added the TS-960e model which includes Keysight's portfolio of PXIe RF instruments, enabling our customers to configure a compact and flexible test solution for both wafer and packaged test.

Our investment in the TS-900 product line is based on our view of the evolving semiconductor test market - a continued progression toward the adoption of test solutions that provide higher value and more flexibility in order to address a wider range of products and more complex functionality while continuing to reduce the Cost of Test (CoT), in the digital, mixed-signal, RF, and MEMS markets.

In-house designed "Rack & Stack" systems, re-purposed legacy test systems, or expensive large-scale ATE solutions don't really address the evolving challenges associated with the development and production of semiconductor devices.

Adopting test solutions that are based on open architecture platforms such as PXI/PXIe offers test engineers cost-effective alternatives that can augment existing test platforms as well as providing the basis for new configurable test platforms that can be updated as needed, maximizing the initial investment as well as effectively managing overall life cycle costs for test systems.

Loofie Gutterman, President & Co-Founder
Marvin Test Solutions, Inc.