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February 27, 2012

Linda Rae, President, Keithley Instruments, Inc.

Linda Rae, President, Keithley Instruments, Inc.
Linda Rae, President,
Keithley Instruments, Inc.
For semi T&M suppliers, 2012 will focus on creating tools with the flexibility to handle the growing diversity of the test challenges ahead. Today, semiconductor test has expanded into automotive electronics, new non-volatile memory technologies, TVs/displays, wireless communication devices like smartphones and tablet computers, energy conversion/efficiency devices (photovoltaic cells and panels, power converters, high-brightness LEDs, etc.), and many others.

What does this mean in terms of semi companies' test and analysis requirements? Essentially, it means that, as suppliers, we must meet their measurement needs with a broad set of adaptable test tools; one-size solutions simply no longer fit all.

For example, our R&D customers look to us to help them characterize experimental devices based on materials like graphene, silicon carbide, gallium nitride, or even more exotic substances efficiently, and without requiring major re-investments in instruments and systems.

Similarly, in production test, they need parametric test systems that can be cost-effectively reconfigured to accommodate emerging high voltage process requirements, as well as cope with continuing advancements in transistor density scaling.

Keithley's plan for 2012 is to continue our investment in developing new products like our Model 2651A High Power System SourceMeter(R) instrument, as well as enhancements to our Model 4200-SCS Semiconductor Characterization System and S530 Parametric Test System, so we can support the production and R&D applications essential to the next generation of devices.

Linda Rae, President
Keithley Instruments, Inc.