February 27, 2012
Linda Rae, President, Keithley Instruments, Inc.
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Linda Rae, President, Keithley Instruments, Inc.
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For semi T&M suppliers, 2012 will focus on creating
tools with the flexibility to handle the growing diversity of the test
challenges ahead. Today, semiconductor test has expanded into automotive
electronics, new non-volatile memory technologies, TVs/displays, wireless
communication devices like smartphones and tablet computers, energy conversion/efficiency
devices (photovoltaic cells and panels, power converters, high-brightness LEDs,
etc.), and many others.
What does this mean in terms of semi companies' test and
analysis requirements? Essentially, it means that, as suppliers, we must meet
their measurement needs with a broad set of adaptable test tools; one-size
solutions simply no longer fit all.
For example, our R&D customers look to
us to help them characterize experimental devices based on materials like
graphene, silicon carbide, gallium nitride, or even more exotic substances
efficiently, and without requiring major re-investments in instruments and
systems.
Similarly, in production test, they need parametric test systems that
can be cost-effectively reconfigured to accommodate emerging high voltage
process requirements, as well as cope with continuing advancements in
transistor density scaling.
Keithley's plan for 2012 is to continue our investment in developing
new products like our Model 2651A High Power System SourceMeter(R) instrument, as
well as enhancements to our Model 4200-SCS Semiconductor Characterization
System and S530 Parametric Test System, so we can support the production and
R&D applications essential to the next generation of devices.
Linda Rae, President
Keithley Instruments, Inc.
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